Project Description

Today’s cutting edge microscope technology needs IDE ultimate environment control

An electron microscope’s finely targeted electron beam and ultra-sensitive detectors are readily impaired by building electrical conduits, vacuum pumps, mechanical equipment, nearby traffic and even other microscopes. At times, the source of the image blur is intermittent and unknown. With IDE’s combination AC/DC sensor and flexible positioning capability, the source of the disturbance doesn’t matter. Image quality is ensured.


Sample SEM image – 15kV acceleration voltage; 19 mm work distance – with EMI disturbance without (left) and with (right) IDE compensation.