Project Description

The latest advance in EMI compensation

The latest advance in EMI compensation
Probe placement at the point of measurement without interference effects
Greatest EMI field reduction over the broadest control bandwidth
Lowest noise in the industry
Flexible installation options include in-wall, wall mount or sleek styled cage
Since IDE pioneered the first commercially available active compensation system for electromagnetic stray fields, we have stayed ahead of the competition in delivering the most advanced solutions for electron microscopy needs. Already the gold standard in performance, now, IDE’s fifth generation MK product takes the technology to a new level.